Ampul inspector using multiple line scan cathode-ray tube

ABSTRACT

A device for electronically scanning, with a multiple line scan, a rotating ampul to detect foreign particles therein, a signal being produced in which pulses represent the particles. The pulses are counted in the binary system and a decimal count derived therefrom which is compared with a selected standard. A Braun tube is used to display the particles.

United States Patent Inventor Hoshitaka Nakamura N0. 33, 2-chomeIchigaya Kaga-cho Shinjuku-ku, Tokyo, Japan Appl. No. 637,461 Filed May10, 1967 Patented Apr. 27, 1971 Priority Nov. 26, 1966 Japan 41/7733]and 41/77332 AMPUL INSPECTOR USING MULTIPLE LINE SCAN CATHODE-RAY TUBE10 Claims, 7 Drawing Figs.

U.S. Cl 250/223, 3 56/ 1 96 Int. Cl G06m 7/00 Field of Search 250/222(M), 223 (B); 36/196- l98; 178/7.7

TUBE l2 Calhoun Primary Examiner-James W. Lawrence AssistantExaminer-Martin Abramson Attorney-Waters, Roditi, Schwartz & Nissen "KB,I

', AMPam:

ascrmrme (444524 [9 0 b References Cited UNITED STATES PATENTSSachtleben ABSTRACT: A device for electronically scanning, with amultiple line scan, a rotating ampul to detect foreign particlestherein, a signal being produced in which pulses represent theparticles. The pulses are counted in the binary system and a decimalcount derived therefrom which is compared with a selected standard. ABraun tube is used to display the parti- Patented April 27, 1911 3Sheets-Sheet I GEAZ FIG.2

AMPOUL E I 1 MOM/70R 5/840 I4 7055 S MOW/7'0"? 676. 66M

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FIG.3

AMPUlL INSPECTOR USING MULTIPLE LINE SCAN CATHODE-RAY TUBE BRIEF SUMMARYOF THE INVENTION The invention is directed to object examining apparatuscomprising support means for supporting and rotating said object,electronic means for effecting at least one multiple line scanning ofsaid object to detect particles of fine matter therein, signal means torepresent the thusly detected particles in an electron signal andcounting means to count the thusly represented particles, said particlesbeing represented as pulses inv said electronic signal and wherein adifferent number of particles can be counted for each scanning.

The counting meansincludes means to remember the largest count for saidobject and means to generate a signal when a predetermined count isreached.

Specifically, the counting means includes binary counting means forcounting the pulses and representing the same in the binary system,means to convert the binary representation into a decimal representationand to remember the largest count for said object and means to establisha standard tolerable count for the object and to generate a signal whenthe standard tolerable count is matched.

In further accordance with the invention, means is coupled to the camerameans to generate horizontal and vertical synchronizing signals forcontrolling the rate of scanning and means is provided to modify thehorizontal and vertical synchronizing signals for controlling the numberof lines in each scan and the distance between said lines.

The invention further contemplates the provision of object detectionmeans to examine the presence of the object in the support means and togenerate a start signal to actuate said camera means.

BRIEF DESCRIPTION OF THE DRAWING FIG. 1 shows the image of particles offoreign matter contained in an ampul as shown with scan lines on a Brauntube;

FIG. 2 shows the image of foreign matter signals alone appearing on theBraun tube which indicates the size and/or the number of particles offoreign matter;

FIG. 3 is a block diagram showing the system provided in accordance withthe present invention;

FIG. 4-A is a diagram showing the signals occurring in respectiveportions of the device of this invention based on a horizontalsynchronizing signal;

FIG. 4'B is a diagram showing the signals at the respective portions ofthe device of this invention based on a vertical synchronizing signal(with regard to the signals, they are classifted as inputs and outputsof the respective means and various alphabetic notations are accordinglygiven to them to identify the means with which they are associated);

H6. 5 is a diagramvshowing foreign matter" signals and resettingsignals; and

FIG. 6 is a block diagram showing a counting and maximum-value storingcircuit used in accordance with the invention.

DETAILED DESCRIPTION The present invention relates to apparatus forautomatically inspecting, in accordance with a predetennined standard,the surface or the inside of various objects or materials.

The present invention can be used for automatically and continuouslyinspecting ampuls or baeyers having chemicals sealed therein. Theapparatus of the present invention can also be used for the examinationof the condition of the surface of a solid substance such as theuniformity of the surface or for the detection of scars on the surfaceof the solid substance, or it can be used to inspect for microbesfloating in a fluid scaled within a transparent container.

Bad ampuls can be characterized, for example, by a lack or excess ofchemicals contained therein, contamination of or scars on the externalwalls thereof, or particles of foreign matter contained in suchchemicals (such as glass, fiber, dust, crystals or the like). In thefollowing text the inspection of ampuls containing particles of foreignmatter is in particular explained.

Hitherto, the inspection of ampuls such as mentioned above has mostfrequently been carried out by the naked eye and, therefore, has notbeen effective. The irregularity of the inspections, attributable to thedifference of individual inspectors, has been remarkable and accuracyhas not been very high. There have been a great number of problems inthis field, and there is a great need for an automatic ampul inspectorwhich has sufficient inspecting accuracy for reliably removing badampuls and which has sufficient speed for maintaining an acceptableinspecting efficiency. At the same time, the above-mentioned need for anautomatic ampul inspector has become greater in view of the fact thatproduction efficiency can be improved by means of combining processesfor production and for inspection. There have hitherto been madeattempts to replace inspection by means of the naked eye by inspectioncarried out by various mechanisms. Some of these attempts have actuallybeen used to a limited extent.

There have been proposed, for example, devices to illuminate ampuls sothat particles of foreign matter can be easily detected, or means tofloat foreign matter by turning the ampuls upside down on conveyorsemployed therefor.

As a substitute for inspection by means of the naked eye, a secondaryemission electron amplifying tube or photoelectric tube has been used.

In the above-mentioned conventional means, ampuls are rotated to floatwhatever particles of foreign matter are located therein, and then saidampuls are placed in position for inspection. The ampuls are thenilluminated and the light rays from a part of the surface ,of the sideof the liquid-containing ampul are condensed on the light-receivingsurface of the above-mentioned photoelectric tube. In the eventparticles of foreign matter are mixed up in the chemical solution in anampul, the foreign matter floats across a part of the surface of theampul and accordingly illumination of the light-receiving surface ischanged. The change of the illumination is represented by a change ofelectric current. When a change of electric current is observed, it isdetermined that particles of foreign matter are present in the chemicalwithin the ampul.

However, with regard to contamination or scars on the external wall ofthe ampul, these cannot be detected, while "the ampul is not movingbecause they do not result in a change of electric current even with thepassage of time. Further, when an ampul is rotated at a given positionfor inspection, the ampul itself works as an irregular convex lens tochange the direction of illumination, and therefore the illumination onthe light-receiving surface is changed even by an ampul containing noforeign matter. This type of change is erroneously mistaken asindicating an ampul containing particles of foreign matter.

Moreover, when the known ampul-transmitting means as a whole issubjected to the slightest shaking such as originates from a motor, theillumination on the light-receiving surface is changedfAlso, theillumination of the light source itself is changed even by the slightestvariations of voltage. Errors under these circumstances cannot beavoided.

In addition to the above, the fact that the inspection requires severalseconds is a drawback in view of the need for efficiency in inspection.

In accordance with the present invention, an electronic camera isemployed to take pictures or images of the objects to be inspected. Bychanging the number of the scanning lines of the camera tube of saidelectronic camera, the interval of the scanning lines is used as avariable inspection unit, and particles of foreign matter or scars orcontamination of the wall of the ampuls are inspect-measured.

In case a particle of foreign matter is comparatively large (seeparticle A in FIG. 1) and covers several scanning lines, the size of theparticle of foreign matter is represented by several foreign mattersignals. If a particle of foreign matter is comparatively small (seeparticles B and C in FIG. 1), such particle of foreign matter isrepresented by a single foreign matter signal. The foreign mattersignals appear in the fonn shown in FIG. 2 on a monitor Braun tube.

In accordance with the present invention, the size of detectable foreignmatter may be as low as 5 microns. It is, however, possible to select alarger particle size as the minimum standard on which the inspectiontube is to be based.

Another problem with which the invention is concerned is due to the factthat particles of foreign matter are floating during the time duringwhich the inspection is being carried out. Due to this, there is thepossibility that a few particles are counted as only one particle byreason of their being aligned with each other in front of the camera. Inorder to avoid this possibility, in accordance with the presentinvention, a plurality of electronic pictures can be taken for eachampul, and the picture which shows the maximum number of particles offoreign matter is the one from which the quality of an ampul isdetennined with reference to such maximum value.

It is an object of this invention to provide an automatic inspectorparticularly for use in detecting the amount of miscellaneous minuteforeign substances contained in a solution within an ampul in a mostaccurate manner. Other objects and advantages of this invention willfurther become apparent hereinafter.

With particular reference to FIGS. 3 and 4, an ampul 17 is, inaccordance with the invention, first rotated in one direction whilestanding erect by means of an automatic transmitting means 19 (therotational velocity thereof being less than about 6,000 rpm), and thensaid ampul is rotated in the opposite direction. By means of saidrotation in the opposite direction, centripetal force is brought aboutand the particles of foreign matter are floated. Parallel light rays areprojected through the bottom of the ampul 17 by means of a light source18 in order to illuminate the particles of foreign matter within theliquid contained in the ampul. The image of the entire chemical solutionwithin the ampul is formed, through a telescopic lens system of largefocal length, on the camera tube of an electronic camera 1 arranged atone side of the ampul 17.

The resolution of the camera tube can be varied by changing theoscillation frequency of the horizontal synchronizing signals of thevariable horizontal and vertical synchronizing signal generator 3. Forexample, it is possible to change the distance between the scanninglines within the range of from several tens of microns to severalhundred microns by changing the horizontal synchronizing signals withinthe range of from 200 to 400 lines (see signal he in FIG. 4-A; alsosignal p.h in FIG. 4-8) with reference to the vertical synchronizingsignal each one-fiftieth of a second (see signal a.c in FIG. 4-A).

By having the vertical synchronizing signal variable, the time requiredfor taking a picture is changed from one-fiftieth to one-thirtieth of asecond. Thereby the time required for exposure is changed. The contrastof the image can be changed accordingly.

It is recommended that, in order to obtain vertical synchronizingsignals of a comparatively lower frequency, the outputs of two crystaloscillating members having different, comparatively higher, oscillationfrequencies should be added to make a signal having a frequency of lessdifference. Such signal should be utilized as the vertical synchronizingsignal.

The image from the camera tube (see wave d of FIG. 4-A) is enlarged onthe monitor Braun tube 16 when the contact is switched over to contact dand can be observed with the naked eye.

On the other hand, the wave d of the image can be shaped by means of avideo-signal-shaping circuit 2, whereby the wave e is formed. For this,each small projection x on the wave d, which projection shows theexistence of a particle of foreign matter, is formed into a pulse y.

Wave form e is stripped of the horizontal and vertical synchronizingsignal components by means of a horizontal and vertical synchronizingsignal erasing circuit 6, whereby there is formed a video wave 3 of theimage alone. This signal is transmitted to a gate circuit 7 forcontrolling the number of photographs.

In FIG. 4-A, signal f is the signal for erasing the horizontalsynchronizing signal, and signal 1' is the signal for erasing thevertical synchronizing signal. Both of these signals are generated bythe erasing signal-generating circuit 4.

An inspection starting signal I which detects the fact that an ampul hasbeen placed at the predetermined inspecting position is generated in aphotoelectric means 12 and transmitted to a circuit 5 for generating asignal to set up the number of inspection photographs to be taken. Thecircuit 5 receives the signal I and the vertical synchronizing signal pat its input and delivers, through a contact piece 5a which is set on anappropriate contact, the rectangular wave i of FIG. 4-B having aduration corresponding to the desired number of inspection images.Rectangular wave i has a leading edge in coincidence with the verticalsynchronizing signal immediately following the signal t, and a trailingedge following the vertical synchronizing signal corresponding to thedesired number of images. The gate signal for the case of 4 images isshown. The gate signal i is transmitted from the above-mentioned circuit5 to a set-signal-generating circuit 8 and a gate circuit 7. The gatecircuit 7, which is used for controlling the number of photographs, isan AND-circuit. The AND-circuit 7 receives the video-shaping signal gand the rectangular wave i and generates the foreign matter signal j.

The foreign matter signal j and the reset signal r, produced by shapingthe vertical synchronizing signal within the time corresponding to thenumber of the desired inspection images, enter a digital counter circuit9, and the foreign matter signal j is divided for each image by thereset signal r and is counted.

The counter circuit 9 counts out how many particles of foreign matterare present by the minimum unit of the measurement of foreign matter,i.e., the distance between the scanning lines as the length ofinspection unit.

The counter circuit 9 of FIG. 6 is composed of four flip-flop circuitsand can therefore count up to four figures on a binary number basis,i.e., up to 16 in accordance with the decimal system.

The counted value signal It enters the counted value distributioncircuit 10 composed of an AND-combination of diodes. The total number ofparticles of foreign matter within one image can be obtained thereby.The pulses whose number corresponds to said total are generated in turnat the output terminal thereof. As the counted value distributioncircuit, a tree circuit or ring-counter mechanism can be employed.

As many flip-flops as are required for the maximum count possible in thecounter circuit 9 are provided in a maximum memory circuit 11 at theoutput of the counted value distribution circuit 10. Said flip-flops areso modified, for instance, by using diodes that in case a pulse signalonce enters the input, it

is not reversed even if succeeding pulse signals enter the input,

unless reset signal enters.

When the counting pulses of one image from the counter circuit 9 enterthe input terminal of the counted value distribution circuit 10, as manypulses as are equal to the number of the counted value of the particlesof foreign matter belonging to one image, appear at the outputs of thecircuit 10 and, among the flip-flops (flmf as many flip-flops ascorrespond to the counted value are reversed. In case the counted valueof the particles of foreign matter of the image which enters the circuit10 is smaller than the counted value of the particles of foreign matterof the preceding image, the memory state of the flip-flop is notchanged. In case it is larger than the counted value of the particles offoreign matter on the preceding image, as many flip-flops as correspondto the difference from the counted value of the particles of foreignmatter of the preceding image are newly reversed and the larger numberis memorized.

Thus, any number of particles of foreign matter of an image which isgreater than the number of particles of foreign matter already memorizedis newly memorized. The maximum memory circuit 11 therefore onlymemorizes the number of particles of foreign matter of the image havingthe maximum number of such particles. This maximum value is retained onthe indicator tube of the maximum memory signal indicating circuit 13and the indication thereof is maintained until the result of theinspection of the next ampul arrives.

The movable contact 15a of a selection circuit 15 for generating asignal for excluding bad ampuls is, in advance, connected to one of theoutput terminals of the flip-flops of the maximum memory circuit 11 inaccordance with a standard value selected for passing or rejectingampuls. When the particular flip-flop involved delivers an output signalthrough the movable contact 15a a judgement signal n is released bycircuit 15.

The circuits of FIG. 6 include the counter 9, the counted valuedistribution circuit or matrix (composed, for example, of a diodematrix), and the memory circuit 11 (in accordance with the illustratedembodiment), said memory portion is composed of 16 flip-flops. Thisnumber corresponds to the decimal number corresponding to the binarynumber which can be represented by four flip-flops of the counterportion. The judging or selection circuit for determining the maximumallowable number of particles of foreign matter is also included. FIG. 5shows the reset signal r and the foreign matter signal j to be counted.

The foreign matter signal j arriving at the digital counter circuitconsists of a train of pulses whose pulse width w and distance d are notregular, but whose amplitude is regular (see FIG. 5).

The reset signal (see FIG. 5), for showing clearly the limits of eachgroup of incoming-valve representing groups, is supplied to the counterportion and the number of pulses is determined for each group.

The pulses of the respective groups are supplied to one input terminalof the counter 9. When the signal r indicating the beginning or end ofeach group enters via the other input terminal of the counter portion 9the digital count is reduced to 0 and the counter is ready for thearrival of the incoming pulse group.

The value counted by the counter for each group enters the matrix 10 inthe form of a counted value signal. Circuit 10 is a counted value outputdistribution matrix composed of an AND-combination of diodes. The binarysystem counted value signal is, in turn, converted into a decimal systemcounted value signal. In other words, as many pulses as corresponds tothe decimal number are generated on the output side and, then, theyenter flip-flop f flip-flop f flip-flop f and set up the flip-flopscorresponding to a decimal number.

With regard to the flip-flops on the output side, they areconventionally designed so that 0 is switched to 1 when an input pulseis present but, even if another input pulse should be received, thestate of l is retained without being switched to 0. The flip-flops canbe turned to 0 only by a reset signal.

By way of explanation of the operation of the embodiment shown in FIG.6, it is presumed, for example, that groups of four, three and eightpulses arrive at the circuits, in this order, and that the specificvalue 8 of the particles of foreign matter 'should be detected. Firstly,the four pulses are counted by the flip-flops (f through f to be 1, 0and 0, and enter the matrix 10. Through the output terminal thereof, theflip-flops (f, through f,) are switched from the original state'of 0, 0,O and 0 to the state of l, l, l and 1. Thus the number 4 is stored.Next, the pulse r showing the end of the group enters the counter 9 andthen the group composed of three pulses enters the counter 9. Theflip-flops of the counter 9 count to the state of O, l and l butflip-flops), through f have already memorized the values of thepreceding four pulses and have assumed the state of l, l and 1. Thesestates are not changed by the incomi'ng three-pulse group. Next, thepulse r indicating the end of the group enters, and the subsequent groupcomposed of eight pulses enters the counter 9. Eight pulses in all areadded one by one to the flip-flops f, to f, on the output side of thematrix It).

The flip-flops f, through 1} have already memorized and retained thevalue of four by assuming the states of l, l, l and 1. Therefore, theflip-flops, which are newly converted to I, l, l and 1, are theflip-flops f through 12,.

The movable contact 15a of the judging signal-generating circuit 15 is,in advance, connected to the output side of the flip-flop 1;, fordetecting the specific value 8. Therefore, at the moment when the eightpulses arrive and the flip-flops f, through f are converted to Is sothat the flip-flop j}, is converted into I, the judging signal for theconfirmation of the presence of the eight pulses is transmitted to thejudging signal-generating circuit 15.

When one judging inspection is terminated, the reset signal forconverting the flip-flopsf through f is transmitted and the circuits arereadied for the next inspection.

Bad ampuls are detected by means of the generation of the judgingsignal. Good ampuls are transmitted to a subsequent process. The judgingsignal n is delayed relative to the starting signal 1. Bad ampuls areremoved from a position through which several ampuls pass between thetime at which a bad ampul is detected and its removal.

In the diagram of FIG. 3, circuit 14 is a signal-generating circuit fora video-shaping signal monitor signal s, and is used for projecting theimage of FIG. 2 on the monitor 16.

In the diagram of FIG. 3, circuit 4 is a signal-generating circuit forerasing the horizontal and vertical synchronizing signals, and generatesthe signal f for erasing the horizontal synchronizing signal and thesignal 1' for erasing the vertical synchronizing signal. These signalsare transmitted to the horizontal and vertical signal-erasing circuit 6.

As already mentioned, several tens of pictures of the state of the wallof each ampul and the particles of foreign matter are taken. The imagewhich shows the worst state of an ampul is taken as the one whichrepresents the state of that ampul. Thereby, a strict examination of theampuls can be carried out.

When ampuls are continuously inspected by using the device of thepresent invention, from one to 10 pictures are taken per ampul. Theinspection can be finished within from one-fiftieth to one-fifth of asecond.

When ampuls are inspected by the naked eye or by photoelectric means,the accuracy of the inspection is from 30 to 50 percent. When the deviceof the present invention is employed, the accuracy of inspection is veryhigh and ranges from 96 to 99.4 percent. In addition, the image of anampul is enlarged as much as 1,000 times on the monitor. Therefore, itis very easy to detect the main cause of the foreign matter contained inthe ampul.

In accordance with the explanation already given, scars on the wall ofan ampul or dust adhering to the external wall of an ampul are detectedas foreign matter. In case it is desired that only particles of foreignmatter contained in an ampul should be detected, the rotation of theampul is increased, and the image of the dust is obscured and becomesundetectable. It is thus possible to detect only particles of foreignmatter within the ampul.

lclaim:

1. Object examining apparatus comprising support means for supportingand rotating said object, electronic camera means for effecting at leastone multiple line scanning of said object to detect particles of foreignmatter therein, signal means to represent the thusly detected particlesin an electron signal, and counting means to count the thuslyrepresented particles, said particles being represented as pulses insaid electronic signal and wherein a different number of particles canbe counted for each scanning, said counting means including binarycounting means for counting said pulses and representing the same in thebinary system, means to convert the binary representation into a decimalrepresentation and to remember the largest count for said object, andmeans to establish a standard tolerable count for the object and togenerate a signal when the standard tolerable count is matched.

2. Apparatus as claimed in claim 1, wherein the binary counting meansincludes a plurality of flip-flop circuits the collective states ofwhich constitute a binary representation.

3. Apparatus as claimed in claim 2, wherein the means to convert thebinary representation includes a matrix coupled to said flip-flopcircuits and a further plurality of flip-flop circuits coupled to saidmatrix.

4. Object examining apparatus comprising support means for supportingand rotating said object, electronic camera means for effecting at leastone multiple line scanning of said object to detect particles of foreignmatter therein, signal means to represent the thusly detected particlesin an electron signal, counting means to count the thusly representedparticles, signal generator means coupled to said camera means togenerate horizontal and vertical signals, means coupled to said signalgenerator means to change" the frequency of the horizontal synchronizingsignals for controlling the distance between scanning lines with respectto the minimum particle size of foreign matter to be detected, and tochange the frequency of the vertical synchronizing signals forcontrolling the time for taking a photograph with respect to the speedof moving particles, and means coupled to said signal generator means toprovide a number of photographs for each object by allowing a number ofvertical signals corresponding to the number of photographs to pass tosaid counting means.

5. Apparatus as claimed in claim 4 comprising object detection means toexamine'for the presence of the object in said support means and togenerate a start signal to actuate said means which provides a number ofphotographs for each object.

6. Apparatus as claimed in claim 4, wherein the synchronizing signalsappear in said electronic signal, the apparatus further comprising meansto erase the synchronizing signals therefrom.

7. Apparatus as claimed in claim 5, wherein the object is an ampul,including a light source for transmitting light through the arnpul insaid support means.

8. Apparatus as claimed in claim 4, wherein said camera means produces asuccession of images of said object in a plurality of scans, saidcounting means counting the particles in each scan and wherein adifferent number of particles can be counted for each scan, means toremember the largest count for said object and means to generate asignal when a predetermined count is reached.

9. Apparatus as claimed in claim 5, wherein said camera means produces asuccession of images of said object in a plurality of scans, saidcounting means counting the particles in each scan and wherein adifferent number of particles can be counted for each scan, means toremember the largest count for said object and means to generate asignal when a predetermined count is reached.

10. Apparatus as claimed in claim 1 comprising means to display visuallythe remembered largest count.

1. Object examining apparatus comprising support means for supportingand rotating said object, electronic camera means for effecting at leastone multiple line scanning of said object to detect particles of foreignmatter therein, signal means to represent the thusly detected particlesin an electron signal, and counting means to count the thuslyrepresented particles, said particles being represented as pulses insaid electronic signal and wherein a different number of particles canbe counted for each scanning, said counting means including binarycounting means for counting said pulses and representing the same in thebinary system, means to convert the binary representation into a decimalrepresentation and to remember the largest count for said object, andmeans to establish a standard tolerable count for the object and togenerate a signal when the standard tolerable count is matched. 2.Apparatus as claimed in claim 1, wherein the binary counting meansincludes a plurality of flip-flop circuits the collective states ofwhich constitute a binary representation.
 3. Apparatus as claimed inclaim 2, wherein the means to convert the binary representation includesa matrix coupled to said flip-flop circuits and a further plurality offlip-flop circuits coupled to said matrix.
 4. Object examining apparatuscomprising support means for supporting and rotating said object,electronic camera means for effecting at least one multiple linescanning of said object to detect particles of foreign matter therein,signal means to represent the thusly detected particles in an electronsignal, counting means to count the thusly represented particles, signalgenerator means coupled to said camera means to generate horizontal andvertical signals, means coupled to said signal generator means to changethe frequency of the horizontal synchronizing signals for controllingthe distance between scanning lines with respect to the minimum particlesize of foreign matter to be detected, and to change the frequency ofthe vertical synchronizing signals for controlling the time for taking aphotograph with respect to the speed of moving particles, and meanscoupled to said signal generator means to provide a number ofphotographs for each object by allowing a number of vertical signalscorrespOnding to the number of photographs to pass to said countingmeans.
 5. Apparatus as claimed in claim 4 comprising object detectionmeans to examine for the presence of the object in said support meansand to generate a start signal to actuate said means which provides anumber of photographs for each object.
 6. Apparatus as claimed in claim4, wherein the synchronizing signals appear in said electronic signal,the apparatus further comprising means to erase the synchronizingsignals therefrom.
 7. Apparatus as claimed in claim 5, wherein theobject is an ampul, including a light source for transmitting lightthrough the ampul in said support means.
 8. Apparatus as claimed inclaim 4, wherein said camera means produces a succession of images ofsaid object in a plurality of scans, said counting means counting theparticles in each scan and wherein a different number of particles canbe counted for each scan, means to remember the largest count for saidobject and means to generate a signal when a predetermined count isreached.
 9. Apparatus as claimed in claim 5, wherein said camera meansproduces a succession of images of said object in a plurality of scans,said counting means counting the particles in each scan and wherein adifferent number of particles can be counted for each scan, means toremember the largest count for said object and means to generate asignal when a predetermined count is reached.
 10. Apparatus as claimedin claim 1 comprising means to display visually the remembered largestcount.